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Temperature Tolerance with Yiyang Li

Assistant Professor of Materials Science and Engineering Yiyang Li, prepares to test the temperature tolerance of a high-temperature memory chip in the Herbert H. Dow Building on the North Campus of the University of Michigan in Ann Arbor, on November 26, 2024.

 

The Li+ Group is conducting research to develop new electrochemical materials for energy storage, brain-inspired computing, and information processing.

 

Photo: Brenda Ahearn/University of Michigan, College of Engineering, Communications and Marketing

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Uploaded on December 3, 2024
Taken on November 26, 2024