Great Moments in Semiconductor History, No. 9

1982

 

Great Moments in Semiconductor History, No. 9

painting by Jim deLeon

 

Accompanying text:

"Important advancements in automatic testing were made in the 1960s by Gordon Ness (left) who developed the pulsed direct reading beta tester at Fairchild, and by Nicholas deWolf (center) and Alex d'Arbeloff (right) of Teradyne who developed the J259 computer-operated test system. (No. 9 in a series of paintings by Jim deLeon commemorating 'Great Moments in Semiconductor History,' commissioned by the Semiconductor Equipment and Materials Institute. ©1982, SEMI"

 

part of an archival project, featuring the photographs of nick dewolf

 

© the Nick DeWolf Foundation

Image-use requests are welcome via flickrmail or nickdewolfphotoarchive [at] gmail [dot] com

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