Scanning probe microscope (Veeco Multimode with NanoScope V Controller)
This instrument performs atomic force microscopy (AFM) to measure surface characteristics and imaging for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, among a multitude of other samples. Pictured: Seth Darling, scientist in the Electronic & Magnetic Materials & Devices group at Argonne's Center for Nanoscale Materials.
The Center for Nanoscale Materials (CNM) at Argonne National Laboratory is a joint partnership between the U.S. Department of Energy (DOE) and the State of Illinois, as part of DOE’S Nanoscale Science Research Center program.
Photo courtesy of Argonne National Laboratory.
Scanning probe microscope (Veeco Multimode with NanoScope V Controller)
This instrument performs atomic force microscopy (AFM) to measure surface characteristics and imaging for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, among a multitude of other samples. Pictured: Seth Darling, scientist in the Electronic & Magnetic Materials & Devices group at Argonne's Center for Nanoscale Materials.
The Center for Nanoscale Materials (CNM) at Argonne National Laboratory is a joint partnership between the U.S. Department of Energy (DOE) and the State of Illinois, as part of DOE’S Nanoscale Science Research Center program.
Photo courtesy of Argonne National Laboratory.