birch pollen
The image has been taken with a Teneo Scanning Electron Microscope (SEM), at the Cellular and Molecular Imaging Core Facility (CMIC), Norwegian University of Science and Technology (NTNU).
A scanning electron microscope (SEM) scans a focused electron beam over a surface to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.
Trondheim, Norway
birch pollen
The image has been taken with a Teneo Scanning Electron Microscope (SEM), at the Cellular and Molecular Imaging Core Facility (CMIC), Norwegian University of Science and Technology (NTNU).
A scanning electron microscope (SEM) scans a focused electron beam over a surface to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.
Trondheim, Norway