FERMI-LAT-SCIENTIFIC PLOTS
5
Illustration of tracker design principles. The first two points dominate the measurement of the photon direction, especially at low energy. (Note that in this projection only the x hits can be displayed.) (a) Ideal conversion in W: Si detectors are located as close as possible to the W foils, to minimize the lever arm for multiple scattering. Therefore, scattering in the 2nd W layer has very little impact on the measurement. (b) Fine detector segmentation can separately detect the two particles in many cases, enhancing both the PSF and the background rejection. (c) Converter foils cover only the active area of the Si, to minimize
conversions for which a close-by measurement is not possible. (d) A missed hit in the 1st or 2nd layer can degrade the PSF by
up to a factor of two, so it is
important to have such inefficiencies well localized and identifiable, rather than spread across the active area. (e) A conversion in the structural material or Si can give long lever arms for multiple scattering, so such material is minimized. Good 2-hit resolution can help identify such conversions.
5
Illustration of tracker design principles. The first two points dominate the measurement of the photon direction, especially at low energy. (Note that in this projection only the x hits can be displayed.) (a) Ideal conversion in W: Si detectors are located as close as possible to the W foils, to minimize the lever arm for multiple scattering. Therefore, scattering in the 2nd W layer has very little impact on the measurement. (b) Fine detector segmentation can separately detect the two particles in many cases, enhancing both the PSF and the background rejection. (c) Converter foils cover only the active area of the Si, to minimize
conversions for which a close-by measurement is not possible. (d) A missed hit in the 1st or 2nd layer can degrade the PSF by
up to a factor of two, so it is
important to have such inefficiencies well localized and identifiable, rather than spread across the active area. (e) A conversion in the structural material or Si can give long lever arms for multiple scattering, so such material is minimized. Good 2-hit resolution can help identify such conversions.